Merge commit '1fe4406f374291ab2e86e95a97341fd9c475fcb8'

[qmk_firmware.git] / tmk_core / tool / mbed / mbed-sdk / libraries / tests / mbed / i2c_eeprom_line / main.cpp

diff --git a/tmk_core/tool/mbed/mbed-sdk/libraries/tests/mbed/i2c_eeprom_line/main.cpp b/tmk_core/tool/mbed/mbed-sdk/libraries/tests/mbed/i2c_eeprom_line/main.cpp
new file mode 100644 (file)
index 0000000..26459e8
--- /dev/null
+++ b/tmk_core/tool/mbed/mbed-sdk/libraries/tests/mbed/i2c_eeprom_line/main.cpp
@@ -0,0 +1,147 @@
+#include "test_env.h"
+
+/******************************************************************************
+*  This will test an I2C EEPROM connected to mbed by writing a predefined byte at
+*  address 0 and then reading it back and comparing it with the known byte value a
+*  number of times. This test was written specifically for reproducing the bug
+*  reported here:
+*
+*  https://mbed.org/forum/bugs-suggestions/topic/4128/
+*
+*  Test configuration:
+*
+* set 'ntests' to the number of iterations
+* set 'i2c_speed_hz' to the desired speed of the I2C interface
+* set 'i2c_delay_us' to the delay that will be inserted between 'write' and
+*  'read' I2C operations (https://mbed.org/users/mbed_official/code/mbed/issues/1
+*  for more details). '0' disables the delay.
+* define I2C_EEPROM_VERBOSE to get verbose output
+*
+*  The test ran with a 24LC256 external EEPROM memory, but any I2C EEPROM memory
+*  that uses two byte addresses should work.
+******************************************************************************/
+
+// Test configuration block
+namespace {
+const int ntests = 1000;
+const int i2c_freq_hz = 400000;
+const int i2c_delay_us = 0;
+// const int EEPROM_24LC256_SIZE = (256 * 1024 / 8);   // 256 kbit memory
+}
+
+// End of test configuration block
+
+#if defined(TARGET_KL25Z)
+I2C i2c(PTC9, PTC8);
+
+#elif defined(TARGET_KL46Z)
+I2C i2c(PTC9, PTC8);
+
+#elif defined(TARGET_K64F)
+I2C i2c(PTE25, PTE24);
+
+#elif defined(TARGET_K22F)
+I2C i2c(PTE0, PTE1);
+
+#elif defined(TARGET_K20D50M)
+I2C i2c(PTB3, PTB2);
+
+#elif defined(TARGET_LPC812)
+I2C i2c(P0_10, P0_11);
+
+#elif defined(TARGET_LPC1549)
+I2C i2c(P0_23, P0_22);
+
+#elif defined(TARGET_LPC11U68)
+I2C i2c(SDA, SCL);
+
+#elif defined(TARGET_DELTA_DFCM_NNN40)
+I2C i2c(I2C_SDA0, I2C_SCL0);
+
+#elif defined(TARGET_NUCLEO_F030R8) || \
+      defined(TARGET_NUCLEO_F070RB) || \
+      defined(TARGET_NUCLEO_F072RB) || \
+      defined(TARGET_NUCLEO_F091RC) || \
+      defined(TARGET_NUCLEO_F103RB) || \
+      defined(TARGET_NUCLEO_F302R8) || \
+      defined(TARGET_NUCLEO_F303RE) || \
+      defined(TARGET_NUCLEO_F334R8) || \
+      defined(TARGET_NUCLEO_F401RE) || \
+      defined(TARGET_NUCLEO_F411RE) || \
+      defined(TARGET_NUCLEO_L053R8) || \
+      defined(TARGET_NUCLEO_L073RZ) || \
+      defined(TARGET_NUCLEO_L152RE) || \
+      defined(TARGET_FF_ARDUINO)
+I2C i2c(I2C_SDA, I2C_SCL);
+
+#else
+I2C i2c(p28, p27);
+#endif
+
+#define PATTERN_MASK 0x66, ~0x66, 0x00, 0xFF, 0xA5, 0x5A, 0xF0, 0x0F
+
+int main() {
+    MBED_HOSTTEST_TIMEOUT(15);
+    MBED_HOSTTEST_SELECT(default_auto);
+    MBED_HOSTTEST_DESCRIPTION(I2C EEPROM line read write test);
+    MBED_HOSTTEST_START("MBED_A25");
+
+    const int EEPROM_MEM_ADDR = 0xA0;
+    bool result = true;
+
+    i2c.frequency(i2c_freq_hz);
+    printf("I2C: I2C Frequency: %d Hz\r\n", i2c_freq_hz);
+
+    printf("I2C: Lines pattern write test ... ");
+    int write_errors = 0;
+    for (int i = 0; i < ntests; i++) {
+        char data[] = { 0 /*MSB*/, 0 /*LSB*/, PATTERN_MASK };
+        const int addr = i * 8;   // 8 bytes of data in data array
+        data[0] = ((0xFF00 & addr) >> 8) & 0x00FF;
+        data[1] = (addr & 0x00FF);
+
+        if (i2c.write(EEPROM_MEM_ADDR, data, sizeof(data)) != 0) {
+            write_errors++;
+        }
+
+        while (i2c.write(EEPROM_MEM_ADDR, NULL, 0)) ; // wait to complete
+
+        // us delay if specified
+        if (i2c_delay_us != 0) {
+            wait_us(i2c_delay_us);
+        }
+    }
+
+    printf("[%s]\r\n", write_errors ? "FAIL" : "OK");
+    printf("I2C: Write errors: %d ... [%s]\r\n", write_errors, write_errors ? "FAIL" : "OK");
+
+    printf("I2C: Lines pattern read test ... ");
+    int read_errors = 0;
+    int pattern_errors = 0;
+    for (int i = 0; i < ntests; i++) {
+        char data[8] = { 0 };   // General puspose buffer
+        const int addr = i * 8; // 8 bytes of data in data array
+        data[0] = ((0xFF00 & addr) >> 8) & 0x00FF;
+        data[1] = (addr & 0x00FF);
+
+        // Set address for read
+        if (i2c.write(EEPROM_MEM_ADDR, data, 2, true) != 0) {
+        }
+
+        if (i2c.read(EEPROM_MEM_ADDR, data, 8) != 0) {
+            read_errors++;
+        }
+
+        static char pattern[] = { PATTERN_MASK };
+        if (memcmp(pattern, data, sizeof(data))) {
+            pattern_errors++;
+        }
+    }
+
+    printf("[%s]\r\n", read_errors ? "FAIL" : "OK");
+    printf("I2C: Read errors: %d/%d ... [%s]\r\n", read_errors, ntests, read_errors ? "FAIL" : "OK");
+    printf("EEPROM: Pattern match errors: %d/%d ... [%s]\r\n", pattern_errors, ntests, pattern_errors ? "FAIL" : "OK");
+
+    result = write_errors == 0 && read_errors == 0;
+    MBED_HOSTTEST_RESULT(result);
+}